{"data":{"slug":"kla","etype":"company","name":"KLA","cat":"Semiconductor Equipment","subtitle":"Process control: the inspection tools that make advanced yields possible.","summary":"KLA's metrology and defect-inspection systems are how fabs find nanometer-scale flaws before they become dead dies. At the leading edge — and in multi-die packaging where one bad chiplet kills the assembly — yield economics run through KLA.","attrs":null,"kf":{"hq":"Milpitas, US"},"aliases":["KLA-Tencor","KLAC"],"ticker":"KLAC","exchange":"NASDAQ","hq":"Milpitas, California","founded":null,"website":"https://www.kla.com","status":null,"region":null,"asof":"2026-01-15","sources":[{"url":"https://www.kla.com/","label":"KLA"}]},"meta":{"found":true,"count":1,"served_from":"site cache (no live upstream calls)","as_of":"2026-10-14T09:50:01+00:00","disclaimer":"Research and information only — not investment advice. Structured records carry basis labels (vendor spec / reported / estimate); market quotes are delayed/indicative.","attribution":"Records compiled from vendor documentation, official filings and reputable public reporting; market quotes via financial data providers. See /data-sources."}}